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The BERT error rate tester used in the supercomputing center is heat resistant
The series incorporates a robust heat dissipation design for PHY chips and optical modules, ensuring long-term stability and reliability. The Keysight M8050A high-performance bit error ratio tester (BERT) enables accurate characterization of receivers used in next-generation data center networks and server interfaces. These products reflect that global leadership, addressing data rates from 100 Mbit/s to 64. Versatile 10G multiservice test modules for lab and field. The ML4079ELN is an 8-Lane 112Gbps BERT ideal for OCP signal integrity applications including Layer-1 PCIe-Gen 5, 6, and 7, automotive, transceiver and data center interconnect testing. The ML4079ELN features a wide range of line rate coverage, Ethernet FEC, 34dB+ SerDes equalization, and built-in.
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Optical module VC heat spreader
This paper presents an integrated power electronics module with a vapor chamber (VC) acting as a heat spreader to transfer the heat from the insulated gate bipolar transistor (IGBT) module to the base of the heat-sink. A vapor chamber consists of a copper enclosure. This document describes the characterization of vapor chambers as cooling devices for multiple chip modules. It includes developing and building the testing system, selecting the control and monitoring parameters, designing the vapor. This work presents a demonstration of a coefficient of thermal expansion (CTE) matched, high heat flux vapor chamber directly integrated onto the backside of a direct bond copper (DBC) substrate to improve heat spreading and reduce thermal resistance of power electronics modules.